WELZEK officially releases new Bluetooth HDT (High Data Throughput) options for the T6290 series wireless testers – KM726 for transmitter measurement and KG726 for waveform generation, precisely tailored for next-generation Bluetooth testing requirements.
Bluetooth technology continues to evolve rapidly in wireless communications, pushing performance boundaries for diverse applications. The Bluetooth SIG is advancing four key areas: ultra-low-latency HID, high-definition lossless audio, High Data Throughput (HDT), and higher frequency bands.
Notably, the upcoming HDT technology will boost data rates from 2 Mbps to nearly 8 Mbps, significantly improving wireless transmission performance and stability. This will benefit lossless audio, industrial data transfer, consumer electronics synchronization, and more – powering the next leap in Bluetooth capabilities.
Bluetooth HDT Overview
Bluetooth Higher Data Throughput (HDT) is a major innovation introduced in the Bluetooth Core Specification v6.0, designed to significantly boost LE data transfer capability – achieving a theoretical rate of up to 7.5 Mbps, 3.75× faster than the traditional LE 2M PHY.
Key technical advantages:
Drives advances in performance, energy efficiency, and reliability
Supports higher-order modulation for faster data rates
Increases LE capacity
With its high speed, low latency, and standardization, Bluetooth HDT unlocks new use cases – enhancing existing wireless experiences and enabling what was previously limited by bandwidth. Future applications include consumer audio/video entertainment (lossless audio, ultra-low-latency gaming peripherals), smart interaction (AR/VR glasses), automotive electronics (in-car audio), and file transfer (tablets, smartphones) – greatly improving efficiency and everyday convenience.
Bluetooth HDT Features
HDT achieves breakthrough performance through coordinated PHY and protocol layer optimizations, delivering more efficient wireless connectivity for IoT and consumer electronics.
PHY Layer
Advanced modulation: π/4-QPSK, 8PSK, and 16QAM at 2 Msym/s
Convolutional coding with dynamic puncturing (e.g., 2/3 code rate) – balancing speed and stability
Enhanced 32-bit CRC (vs. traditional 24-bit) for stronger data integrity
Protocol Layer
Three flexible packet formats:
Short Format – control signaling
Format 0 – backward compatible with legacy modes
Format 1 – multi-PDU aggregation and smart block segmentation
Key mechanisms:
Selective retransmission via TxBlockMap – reduces wasted retransmissions
Block-level ACK (RxBitmap) and dynamic rate adaptation (Link Quality feedback) – intelligently adapts to complex wireless environments
Bluetooth HDT Test Solution
HDT devices face new challenges in hardware design, protocol stack development, test validation, and ecosystem compatibility – from chip design to final product deployment.
WELZEK introduces its Bluetooth HDT test solution to help device vendors quickly upgrade testing capabilities. The T6290 series testers support HDT testing via software upgrade, enabling PHY layer analysis, multi-rate testing, and precise measurement of key parameters such as throughput, BER, and EVM.
Rich Test Scenarios
Covers the entire HDT testing process for chips, modules, and end products – including R&D validation, RF conformance certification, and production line testing.
Supports All Bluetooth Standards
The T6290 series supports Bluetooth 1.0–6.0, including BR/EDR/LE/CS/HDT.
Simultaneous TX/RX Testing
Enables OTA testing, TX testing, RX testing, and simultaneous TX/RX testing.
Test Cases
Power vs.Time
Nominal Pow
Peak Pow
Payload Length
EVM
HDT Control Message
Frequency Error
Frequency Drift
Max Drift Rate
I/Q Origin Offset
Spectrum ACP
