As smart vehicles enter the software-defined era, technologies such as UWB digital keys, 5G-V2X, Bluetooth 6.0 high‑precision positioning, and StarFlash are rapidly being adopted. OEMs and component suppliers face three major challenges: multi‑technology integration, complex testing standards, and redundant equipment investment.

WELZEK, with deep expertise in wireless communications testing, introduces a full‑stack wireless test solution for the smart automotive industry chain. Based on a proprietary wireless tester platform, it covers the entire chain from components to Tier 1/Tier 2 suppliers to complete vehicles. One tester supports current and future wireless standards, delivering accurate, reliable, and cost‑effective testing for R&D validation and mass production of core automotive components.

Full‑Chain Test Coverage

The WELZEK wireless tester breaks the traditional limitation of serving only a single stage, supporting the entire lifecycle of wireless communication components in smart vehicles:

• Component manufacturers – RF performance validation of chips/modules

• Tier 1/Tier 2 suppliers – RF testing of in‑vehicle wireless modules

• OEMs – RF testing of wireless components and systems

Coverage of Advanced Wireless Standards

• UWB：Supports FiRa/CCC digital key standards for high-precision testing

• 5G：Covers 5G-V2X automotive-grade communication module testin

• Bluetooth 6.0：Supports new positioning features such as channel sounding

• NearLink SLE/SLP：Compatible with both SLE and SLP modes, accelerating the adoption of domestic short-range wireless technology in vehicles

 All‑in‑One Integrated Design – Software‑Defined Testing for the Future

WELZEK follows an All‑in‑One integration philosophy, embedding multi‑standard wireless testing capabilities into a single hardware platform. Users no longer need to replace costly hardware for each emerging technology—simply upgrade software licenses to quickly adapt to new wireless standards.

This approach fundamentally addresses the industry pain points of short technology iteration cycles and high test equipment upgrade costs, helping maximize test asset utilization and effectively reduce testing expenses.